University reference
École Nationale Supérieure d'Électrotechnique, d'Électronique, d'Informatique, d'Hydraulique et des Télécommunications
École Nationale Supérieure d'Électrotechnique, d'Électronique, d'Informatique, d'Hydraulique et des Télécommunications, established in 1907, is an active ROR organization in Toulouse, FR. ROR classifies the organization under education. This profile preserves public aliases, acronyms, external identifiers, location details and organization relationships supplied by the Research Organization Registry, then links the record to other organizations in the same city and country and to recorded airports in the same city. It is a directory profile, not a university ranking, quality assessment, admissions guide or statement of endorsement by ROR or DataOfWorld.
Key facts
- ROR identifier
- https://ror.org/05wfw4946
- Country
- FR
- City
- Toulouse
- Administrative area
- Occitanie
- Website
- https://www.enseeiht.fr
- Established
- 1907
- Organization types
- education
- Acronyms
- ENSEEIHT, INP-ENSEEIHT
- External identifiers
isni 0000 0001 1456 6679 - Organization relationships
parent 033p9g875 related 01zgcd031 - Latitude
- 43.60426
- Longitude
- 1.44367
- ROR last modified
- 2026-06-23
ROR identity context
Names, identifiers and relationships
These identifiers describe the organization record and do not imply ranking or endorsement.
| Acronyms | ENSEEIHT, INP-ENSEEIHT |
|---|---|
| ISNI identifiers | 0000 0001 1456 6679 |
| ROR parent relationships | 033p9g875 |
| ROR related relationships | 01zgcd031 |
OpenAlex institution metadata
Works and research-topic context
Institution-level directory statistics only; they are not rankings, quality judgments or endorsements.
Published topics: Microwave Engineering and Waveguides, Advanced Antenna and Metasurface Technologies, Multilevel Inverters and Converters, Advanced DC-DC Converters, Plasma Diagnostics and Applications, Remote-Sensing Image Classification, Blind Source Separation Techniques, Antenna Design and Analysis, Image and Signal Denoising Methods, Silicon Carbide Semiconductor Technologies
Annual indicator
Institution works indexed by OpenAlex
182.00 works2024
Institution-level yearly works counts in OpenAlex; not a ranking or quality measure. Values retain the source period and unit.
View source data
| Period | works | Source flag | Confidentiality |
|---|---|---|---|
| 2024 | 182.00 works | — | — |
| 2023 | 152.00 works | — | — |
| 2022 | 135.00 works | — | — |
| 2021 | 154.00 works | — | — |
| 2020 | 162.00 works | — | — |
| 2019 | 176.00 works | — | — |
| 2018 | 182.00 works | — | — |
| 2017 | 163.00 works | — | — |
| 2016 | 190.00 works | — | — |
| 2015 | 153.00 works | — | — |
| 2014 | 145.00 works | — | — |
| 2013 | 182.00 works | — | — |
| 2012 | 189.00 works | — | — |
| 2011 | 191.00 works | — | — |
| 2010 | 149.00 works | — | — |
Field-level provenance
Sources for this profile
Dates and licenses apply to the specific facts and series supplied by each source.
Research Organization Registry
- Applicable date
- 2026-07-20
- Dataset version
- dbdfb9b8dad3
- License
- Creative Commons CC0 1.0
- Attribution
- Research Organization Registry (ROR)
DataOfWorld deterministic university profile template
- Applicable date
- 2026-07-20
- Dataset version
- university-profile-v1
- License
- Original DataOfWorld text
- Attribution
- DataOfWorld
OpenAlex metadata
- Applicable date
- 2026-07-31
- Dataset version
- ab999e862008
- License
- Creative Commons CC0 1.0
- Attribution
- OpenAlex; metadata only, no full text or abstracts are published.
Reference data can change. Verify consequential decisions against the original source.